The Resource Advancing risk analysis for nanoscale materials : report from an international workshop on the role of alternative testing strategies for advancement, J. A. Shatkin, Kimberly J. Ong, Christian Beaudrie, Amy J. Clippinger, Christine Ogilvie Hendren, Lynne T. Haber, Myriam Hill, Patricia Holden, Alan J. Kennedy, Baram Kim, Margaret MacDonell, Christina M. Powers, Monita Sharma, Lorraine Sheremeta, Vicki Stone, Yasir Sultan, Audrey Turley, and Ronald H. White

Advancing risk analysis for nanoscale materials : report from an international workshop on the role of alternative testing strategies for advancement, J. A. Shatkin, Kimberly J. Ong, Christian Beaudrie, Amy J. Clippinger, Christine Ogilvie Hendren, Lynne T. Haber, Myriam Hill, Patricia Holden, Alan J. Kennedy, Baram Kim, Margaret MacDonell, Christina M. Powers, Monita Sharma, Lorraine Sheremeta, Vicki Stone, Yasir Sultan, Audrey Turley, and Ronald H. White

Label
Advancing risk analysis for nanoscale materials : report from an international workshop on the role of alternative testing strategies for advancement
Title
Advancing risk analysis for nanoscale materials
Title remainder
report from an international workshop on the role of alternative testing strategies for advancement
Statement of responsibility
J. A. Shatkin, Kimberly J. Ong, Christian Beaudrie, Amy J. Clippinger, Christine Ogilvie Hendren, Lynne T. Haber, Myriam Hill, Patricia Holden, Alan J. Kennedy, Baram Kim, Margaret MacDonell, Christina M. Powers, Monita Sharma, Lorraine Sheremeta, Vicki Stone, Yasir Sultan, Audrey Turley, and Ronald H. White
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
AERDC
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
bibliography
Label
Advancing risk analysis for nanoscale materials : report from an international workshop on the role of alternative testing strategies for advancement, J. A. Shatkin, Kimberly J. Ong, Christian Beaudrie, Amy J. Clippinger, Christine Ogilvie Hendren, Lynne T. Haber, Myriam Hill, Patricia Holden, Alan J. Kennedy, Baram Kim, Margaret MacDonell, Christina M. Powers, Monita Sharma, Lorraine Sheremeta, Vicki Stone, Yasir Sultan, Audrey Turley, and Ronald H. White
Instantiates
Publication
Note
Detached from: Risk Analysis. Vol. 36, No. 8 (2016)
Bibliography note
Includes bibliographical references (pages 1536-1537)
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Control code
ocn958976002
Dimensions
28 cm
Extent
pages 1520-1537
Form of item
regular print reproduction
Media category
unmediated
Media MARC source
rdamedia
Note
  • VBGauthors.
  • kaf
Other physical details
illustrations
Reproduction note
Photocopy.
System control number
(OCoLC)958976002
Label
Advancing risk analysis for nanoscale materials : report from an international workshop on the role of alternative testing strategies for advancement, J. A. Shatkin, Kimberly J. Ong, Christian Beaudrie, Amy J. Clippinger, Christine Ogilvie Hendren, Lynne T. Haber, Myriam Hill, Patricia Holden, Alan J. Kennedy, Baram Kim, Margaret MacDonell, Christina M. Powers, Monita Sharma, Lorraine Sheremeta, Vicki Stone, Yasir Sultan, Audrey Turley, and Ronald H. White
Publication
Note
Detached from: Risk Analysis. Vol. 36, No. 8 (2016)
Bibliography note
Includes bibliographical references (pages 1536-1537)
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Control code
ocn958976002
Dimensions
28 cm
Extent
pages 1520-1537
Form of item
regular print reproduction
Media category
unmediated
Media MARC source
rdamedia
Note
  • VBGauthors.
  • kaf
Other physical details
illustrations
Reproduction note
Photocopy.
System control number
(OCoLC)958976002

Library Locations

    • ERDC - Vicksburg (US Army Engineer Research and Development Center) Borrow it
      3909 Halls Ferry Road, Vicksburg, MS, 39180-6199, US
      32.3019214 -90.8733482
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